Over 50 years ago, the first commercially available SEM was unveiled. Yet, to this day no internationally accepted standard exists for the determination of SEM resolution. Further, to confuse matters ...

Atomic force microscopy (AFM) is utilized for surface measurements with atomic-level resolution — dimensions that are much beyond the highest resolution of optical microscopes. AFM is known to be a ...

In our earlier article 2 we explained that thermocouples generate a voltage/charge (V OUT) and do not require any voltage or current excitation. Readers familiar with the technology can jump to the ...

Teledyne LeCroy today introduced its HDO9000 high-definition oscilloscopes, which incorporate the company’s HD1024 high-definition technology to automatically optimize vertical resolution under ...

Langer EMV-Technik GmbH has introduced a new SX1 near-field probe set with a new member of the SX near-field probe family. SX probes in the set have probe-head high measurement resolution to allow a ...